Published in
American Institute of Physics, Journal of Applied Physics, 7(131), p. 075303, 2022
DOI: 10.1063/5.0080024
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Non-destructive imaging of residual strains in GaN and their effect on optical and electrical properties using correlative light–electron microscopy
Journal article published in 2022 by
G. Naresh-Kumar 
,
P. R. Edwards ,
T. Batten ,
M. Nouf-Allehiani ,
A. Vilalta-Clemente ,
A. J. Wilkinson ,
E. Le Boulbar ,
P. A. Shields ,
B. Starosta ,
B. Hourahine ,
R. W. Martin ,
C. Trager-Cowan
,
P. R. Edwards ,
T. Batten ,
M. Nouf-Allehiani ,
A. Vilalta-Clemente ,
A. J. Wilkinson ,
E. Le Boulbar ,
P. A. Shields ,
B. Starosta ,
B. Hourahine ,
R. W. Martin ,
C. Trager-Cowan
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
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