Published in

Elsevier, Journal of Energy Chemistry, (64), p. 520-530, 2022

DOI: 10.1016/j.jechem.2021.05.005

Links

Tools

Export citation

Search in Google Scholar

Monitoring dynamics of defects and single Fe atoms in N-functionalized few-layer graphene by in situ temperature programmed scanning transmission electron microscopy

This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

Full text: Unavailable

Green circle
Preprint: archiving allowed
Red circle
Postprint: archiving forbidden
Red circle
Published version: archiving forbidden
Data provided by SHERPA/RoMEO