Published in
Royal Society of Chemistry, Nanoscale, 2(12), p. 851-863, 2020
DOI: 10.1039/c9nr09024j
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Correlation between in situ structural and optical characterization of the semiconductor-to-metal phase transition of VO2 thin films on sapphire
Journal article published in 2020 by
Tiziana Cesca 
,
Carlo Scian ,
Emilija Petronijevic ,
Grigore Leahu,
Roberto Li Voti ,
Gianmario Cesarini,
Roberto Macaluso ,
Mauro Mosca ,
Concita Sibilia ,
Giovanni Mattei
,
Carlo Scian ,
Emilija Petronijevic ,
Grigore Leahu,
Roberto Li Voti ,
Gianmario Cesarini,
Roberto Macaluso ,
Mauro Mosca ,
Concita Sibilia ,
Giovanni Mattei
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Abstract
In situ XRD and IR optical measurements demonstrate the coexistence of M1 and R phases during the SMT transition of VO2 thin films.