Published in
American Institute of Physics, Applied Physics Letters, 18(115), p. 183501, 2019
DOI: 10.1063/1.5119227
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Low frequency noise and trap density in GaN/AlGaN field effect transistors
Journal article published in 2019 by
P. Sai 
,
J. Jorudas ,
M. Dub ,
M. Sakowicz ,
V. Jakštas,
D. B. But ,
P. Prystawko,
G. Cywinski ,
I. Kašalynas ,
W. Knap ,
S. Rumyantsev
,
J. Jorudas ,
M. Dub ,
M. Sakowicz ,
V. Jakštas,
D. B. But ,
P. Prystawko,
G. Cywinski ,
I. Kašalynas ,
W. Knap ,
S. Rumyantsev
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
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