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Published in

Royal Society of Chemistry, Nanoscale, 22(11), p. 10961-10967, 2019

DOI: 10.1039/c9nr03730f

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Investigating the detection limit of subsurface holes under graphite with atomic force acoustic microscopy

Journal article published in 2019 by Kevin Yip ORCID, Teng Cui ORCID, Yu Sun ORCID, Tobin Filleter ORCID
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

Full text: Unavailable

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Data provided by SHERPA/RoMEO

Abstract

The subsurface imaging capabilities of atomic force acoustic microscopy (AFAM) was investigated by imaging graphite flakes suspended over holes in a silicon dioxide substrate.