Published in
Elsevier, International Journal of Radiation Oncology - Biology - Physics, 5(83), p. e709-e715
DOI: 10.1016/j.ijrobp.2012.03.006
Links
- ORCID
- Elsevier
- [www.ncbi.nlm.nih.gov] | PDF
- [europepmc.org] | PDF
- [www.ncbi.nlm.nih.gov] | PDF
- [www.ncbi.nlm.nih.gov] | PDF
Tools
Intrafraction Verification of Gated RapidArc by Using Beam-Level Kilovoltage X-Ray Images
Journal article published in 2012 by
Ruijiang Li,
Edward Mok,
Daniel T. Chang,
Megan Daly,
Billy W. Loo,
Maximilian Diehn 
,
Quynh-Thu Le,
Albert Koong,
Lei Xing
,
Quynh-Thu Le,
Albert Koong,
Lei Xing
This paper is available in a repository.
Full text: Download
Postprint:
archiving forbidden
Published version:
archiving forbidden
Data provided by 