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Institute of Electrical and Electronics Engineers, IEEE Journal of Emerging and Selected Topics in Power Electronics, 3(7), p. 1539-1546, 2019

DOI: 10.1109/jestpe.2019.2912623

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Short Circuit Capability and Short Circuit Induced $V_{\mathrm{TH}}$ Instability of a 1.2-kV SiC Power MOSFET

Journal article published in 2019 by Jiahui Sun ORCID, Jin Wei ORCID, Zheyang Zheng ORCID, Yuru Wang ORCID, Kevin J. Chen ORCID
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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