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American Chemical Society, Journal of Physical Chemistry C, 22(122), p. 12047-12051, 2018

DOI: 10.1021/acs.jpcc.8b01661

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Atomic-Scale Electronic Characterization of Defects in Silicon Carbide Nanowires by Electron Energy-Loss Spectroscopy

Journal article published in 2018 by Lunet E. Luna, David Gardner ORCID, Velimir Radmilovic, Roya Maboudian, Carlo Carraro ORCID
This paper was not found in any repository; the policy of its publisher is unknown or unclear.
This paper was not found in any repository; the policy of its publisher is unknown or unclear.

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