Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Electron Devices, 6(63), p. 2334-2339, 2016
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Time-Dependent Failure of GaN-on-Si Power HEMTs With p-GaN Gate
Journal article published in 2016 by
Isabella Rossetto 
,
Matteo Meneghini ,
Oliver Hilt,
Eldad Bahat-Treidel,
Carlo De Santi ,
Stefano Dalcanale,
Joachim Wuerfl,
Enrico Zanoni,
Gaudenzio Meneghesso
,
Matteo Meneghini ,
Oliver Hilt,
Eldad Bahat-Treidel,
Carlo De Santi ,
Stefano Dalcanale,
Joachim Wuerfl,
Enrico Zanoni,
Gaudenzio Meneghesso
This paper was not found in any repository, but could be made available legally by the author.
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