Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Electron Devices, 6(65), p. 2578-2584, 2018
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Impact of Floating Body Effect, Back-Gate Traps, and Trap-Assisted Tunneling on Scaled In0.53Ga0.47As Ultrathin-Body MOSFETs and Mitigation Measures
Journal article published in 2018 by
Saurabh Sant 
,
Paulina Aguirre,
Herwig Hahn ,
Veeresh Deshpande,
Lukas Czornomaz ,
Andreas Schenk
,
Paulina Aguirre,
Herwig Hahn ,
Veeresh Deshpande,
Lukas Czornomaz ,
Andreas Schenk
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