In situ transmission electron microscopy of transistor operation and failure
Journal article published in 2018 by
Baoming Wang 
,
M. Zahabul Islam,
Zahabul Islam ,
M. Aman Haque,
Aman Haque ,
Kelson Chabak,
Michael Snure,
Eric Heller,
Nicholas Robert Glavin
,
M. Zahabul Islam,
Zahabul Islam ,
M. Aman Haque,
Aman Haque ,
Kelson Chabak,
Michael Snure,
Eric Heller,
Nicholas Robert Glavin
This paper is made freely available by the publisher.
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