Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Nuclear Science, 8(64), p. 2069-2078, 2017
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Understanding Charge Collection Mechanisms in InGaAs FinFETs Using High-Speed Pulsed-Laser Transient Testing With Tunable Wavelength
Journal article published in 2017 by
Kai Ni 
,
Andrew L. Sternberg,
En Xia Zhang ,
John A. Kozub,
Rong Jiang ,
Ronald D. Schrimpf,
Robert A. Reed,
Daniel M. Fleetwood,
Michael L. Alles,
Dale McMorrow,
Jianqiang Lin,
Alon Vardi,
Jesus del Alamo
,
Andrew L. Sternberg,
En Xia Zhang ,
John A. Kozub,
Rong Jiang ,
Ronald D. Schrimpf,
Robert A. Reed,
Daniel M. Fleetwood,
Michael L. Alles,
Dale McMorrow,
Jianqiang Lin,
Alon Vardi,
Jesus del Alamo
This paper was not found in any repository, but could be made available legally by the author.
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