Daniel Hiller
0000-0001-8774-4069
3 papers found
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Kinetics of Bulk Lifetime Degradation in Float‐Zone Silicon: Fast Activation and Annihilation of Grown‐In Defects and the Role of Hydrogen versus Light
Silicon Surface Passivation by ALD-Ga$_{2}$O$_{3}$: Thermal vs. Plasma-Enhanced Atomic Layer Deposition
Structural Properties of Al–O Monolayers in SiO2 on Silicon and the Maximization of Their Negative Fixed Charge Density
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