Evgeny Nazaretski
0000-0003-1207-8174
3 papers found
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Bi-continuous pattern formation in thin films via solid-state interfacial dealloying studied by multimodal characterization
Microscopy Instrumentation and Nanopositioning at NSLS-II: Current Status and Future Directions
High-speed raster-scanning synchrotron serial microcrystallography with a high-precision piezo-scanner
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