Published in
American Institute of Physics, Journal of Applied Physics, 8(122), p. 085303
DOI: 10.1063/1.4998745
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In situ stress measurements during MOCVD growth of thick N-polar InGaN
Journal article published in 2017 by
Zakaria Y. Al Balushi,
Joan M. Redwing 
This paper is made freely available by the publisher.
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