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American Institute of Physics, Journal of Applied Physics, 6(122), p. 065304

DOI: 10.1063/1.4998449

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Highly efficient solution-processed phosphorescent organic light-emitting devices with double-stacked hole injection layers

Journal article published in 2017 by Yuehua Chen, Lin Hao, Xinwen Zhang ORCID, Xiaolin Zhang, Mengjiao Liu, Mengke Zhang, Jiong Wang, Wen-Yong Lai ORCID, Wei Huang
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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Abstract

In this paper, solution-processed nickel oxide (NiOx) is used as hole-injection layers (HILs) in solution-processed phosphorescent organic light-emitting diodes (PhOLEDs). Serious exciton quenching is verified at the NiOx/emitting layer (EML) interface, resulting in worse device performance. The device performance is significantly improved by inserting a layer of poly(3,4-ethylenedioxythiophene):poly(styrenesulfonic acid) (PEDOT:PSS) between the EML and NiOx. The solution-processed blue PhOLED with the double-stacked NiOx/PEDOT:PSS HILs shows a maximum current efficiency of 30.5 cd/A, which is 75% and 30% higher than those of the devices with a single NiOx HIL and a PEDOT:PSS HIL, respectively. Improvement of device efficiency can be attributed to reducing exciton quenching of the PEDOT:PSS layer as well as the electron blocking effect of the NiOx layer.