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American Institute of Physics, Review of Scientific Instruments, 5(87), p. 052001

DOI: 10.1063/1.4949004

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Speckle-based at-wavelength metrology of X-ray mirrors with super accuracy

Journal article published in 2016 by Yogesh Kashyap, Hongchang Wang ORCID, Kawal Sawhney ORCID
This paper is made freely available by the publisher.
This paper is made freely available by the publisher.

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