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American Institute of Physics, Applied Physics Letters, 12(110), p. 121905, 2017

DOI: 10.1063/1.4978870

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Observation of individual stacking faults in GaN microcrystals by x-ray nanodiffraction

Journal article published in 2017 by V. Holý, D. Kriegner ORCID, A. Lesnik, J. Bläsing, M. Wieneke, A. Dadgar ORCID, P. Harcuba
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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