Published in
Elsevier, Microelectronics Reliability, (64), p. 660-664, 2016
DOI: 10.1016/j.microrel.2016.07.053
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Dielectric charging phenomena in diamond films used in RF MEMS capacitive switches: The effect of film thickness
Journal article published in 2016 by
M. Koutsoureli,
A. Zevgolatis,
S. Saada,
C. Mer-Calfati,
L. Michalas,
G. Papaioannou,
P. Bergonzo 
This paper was not found in any repository, but could be made available legally by the author.
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