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Elsevier, Geochimica et Cosmochimica Acta, (195), p. 158-170, 2016

DOI: 10.1016/j.gca.2016.09.019

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Mechanisms of deformation-induced trace element migration in zircon resolved by atom probe and correlative microscopy

Journal article published in 2016 by Steven M. Reddy, Arie van Riessen, David W. Saxey ORCID, Tim E. Johnson, William D. A. Rickard, Denis Fougerouse, Sebastian Fischer, Ty J. Prosa, Katherine P. Rice, David A. Reinhard, Yimeng Chen, David Olson
This paper is available in a repository.
This paper is available in a repository.

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