Published in
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS V
DOI: 10.1117/12.657691
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A transient charging model to predict actuation-voltage shift in RF-MEMS capacitive switches
Proceedings article published in 2006 by
Xiaobin Yuan,
James C. M. Hwang,
David Forehand,
Charles L. Goldsmith
This paper was not found in any repository, but could be made available legally by the author.
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