Published in

Volume 6: ASME Power Transmission and Gearing Conference; 3rd International Conference on Micro- and Nanosystems; 11th International Conference on Advanced Vehicle and Tire Technologies

DOI: 10.1115/detc2009-86479

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Period-Doubling Bifurcations in Atomic Force Microscopy

Proceedings article published in 2009 by Andrew J. Dick ORCID, Wei Huang
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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Abstract

The dynamic response of an atomic force microscope cantilever probe is studied for off-resonance excitation and interactions with a soft silicone rubber material. The dynamic response of the probe is simulated using a three-mode approximation of the Euler-Bernoulli beam model for excitation at two-and-a-half times the probe’s fundamental frequency. These simulations are conducted in order to reproduce the period-doubling bifurcation experimentally observed in the response of the probe of a commercial atomic force microscope. In order to duplicate this behavior, parameters within the surface force model are tuned to account for variations in the characteristics of the sample material. Through this work, the relationship between the sample material’s effective stiffness and the response behavior of the probe are studied in an effort to develop the means to identify the local material properties of a sample by characterize the nonlinear response of the probe.