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Conference on Lasers and Electro-Optics

DOI: 10.1364/cleo_si.2016.sf1h.2

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Experimental verification of Raman scattering suppression via ground state depletion for spatial resolution enhancement in label-free microscopy

Proceedings article published in 2016 by Steffen Rieger, Markus Fischedick, Klaus-Jochen Boller, Carsten Fallnich
This paper was not found in any repository; the policy of its publisher is unknown or unclear.
This paper was not found in any repository; the policy of its publisher is unknown or unclear.

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Abstract

Resonance Raman scattering was suppressed by 50% via ground state depletion in Tris(bipyridine)ruthenium(II). This concept of Raman suppression is of high interest for enhancing the resolution of Raman microscopy to below the diffraction limit