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Optica, Optics Letters, 7(33), p. 672, 2008

DOI: 10.1364/ol.33.000672

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Hollow-core waveguide characterization by optically induced particle transport

Journal article published in 2008 by Philip Measor, Sergei Kühn, Evan J. Lunt, Brian S. Phillips, Aaron R. Hawkins ORCID, Holger Schmidt
This paper is available in a repository.
This paper is available in a repository.

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Abstract

We introduce a method for optical characterization of hollow-core optical waveguides. Radiation pressure exerted by the waveguide modes on dielectric microspheres is used to analyze salient properties such as propagation loss and waveguide mode profiles. These quantities were measured for quasi-single-mode and multimode propagation in on-chip liquid-filled hollow-core antiresonant reflecting optical waveguides. Excellent agreement with analytical and numerical models is found, demonstrating that optically induced particle transport provides a simple, inexpensive, and nondestructive alternative to other characterization methods.