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American Institute of Physics, The Journal of Chemical Physics, 9(146), p. 094704

DOI: 10.1063/1.4977739

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Comparing Kinetic Monte Carlo and Thin-Film Modeling of Transversal Instabilities of Ridges on Patterned Substrates

Journal article published in 2016 by Walter Tewes, Oleg Buller, Andreas Heuer, Uwe Thiele ORCID, Svetlana V. Gurevich
This paper is available in a repository.
This paper is available in a repository.

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Abstract

We employ Kinetic Monte Carlo (KMC) simulations and a thin-film continuum model to comparatively study the transverse (i.e., Plateau-Rayleigh) instability of ridges formed by molecules on pre-patterned substrates. It is demonstrated that the evolution of the occurring instability qualitatively agrees between the two models for a single ridge as well as for two weakly interacting ridges. In particular, it is shown for both models that the instability occurs on well defined length and time scales which are, for the KMC model, significantly larger than the intrinsic scales of thermodynamic fluctuations. This is further evidenced by the similarity of dispersion relations characterising the linear instability modes. ; Comment: 8 pages, 5 figures