Published in
ECS Meeting Abstracts, 31(MA2011-02), p. 2086-2086, 2011
DOI: 10.1149/ma2011-02/31/2086
Institute of Electrical and Electronics Engineers, IEEE Transactions on Device and Materials Reliability, 1(11), p. 187-193, 2011
DOI: 10.1109/tdmr.2010.2103314
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Electric-Field-Driven Degradation in off-State Step-Stressed AlGaN/GaN High-Electron Mobility Transistors
Journal article published in 2011 by
Chih-Yang Chang,
Erica A. Douglas,
Jinhyung Kim,
Lu Liu,
Chien-Fong Lo,
Byung-Hwan Chu,
D. J. Cheney,
Brent P. Gila,
F. Ren,
G. D. Via,
David A. Cullen 
,
Lin Zhou,
David J. Smith,
Soohwan Jang,
S. J. Pearton
,
Lin Zhou,
David J. Smith,
Soohwan Jang,
S. J. Pearton
This paper is made freely available by the publisher.
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