Published in
Wiley, physica status solidi (b) – basic solid state physics, 13(242), p. 2570-2574, 2005
Links
Tools
Simultaneous measurement of wafer curvature and true temperature during metalorganic growth of group-III nitrides on silicon and sapphire
Journal article published in 2005 by
A. Krost,
F. Schulze,
A. Dadgar 
,
G. Strassburger,
K. Haberland,
T. Zettler
,
G. Strassburger,
K. Haberland,
T. Zettler
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
Published version:
archiving forbidden
Data provided by 