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Oxford University Press, Journal of Electron Microscopy, 2(49), p. 259-266, 2000

DOI: 10.1093/oxfordjournals.jmicro.a023805

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Fluctuation microscopy: a probe of atomic correlations in disordered materials

Journal article published in 2000 by P. M. Voyles ORCID, J. M. Gibson, M. M. J. Treacy
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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