Published in
American Physical Society, Physical Review Letters, 22(110)
DOI: 10.1103/physrevlett.110.226103
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Interfacial Bonding and Structure ofBi2Te3Topological Insulator Films on Si(111) Determined by Surface X-Ray Scattering
Journal article published in 2013 by
Y. Liu,
H.-H. Wang,
G. Bian 
,
Z. Zhang,
S. S. Lee,
P. A. Fenter,
J. Z. Tischler,
H. Hong,
T.-C. Chiang
,
Z. Zhang,
S. S. Lee,
P. A. Fenter,
J. Z. Tischler,
H. Hong,
T.-C. Chiang
This paper is made freely available by the publisher.
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