Published in

IOP Publishing, Japanese Journal of Applied Physics, 8S(52), p. 08JK02, 2013

DOI: 10.7567/jjap.52.08jk02

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Systematic Optical Characterization of Two-Dimensional Electron Gases in InAlN/GaN-Based Heterostructures with Different In Content

This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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Abstract

Model calculations have been performed to study systematically the formation of a two-dimensional electron gas (2DEG). The results are used for analyzing the photoluminescence properties of corresponding InAlN/GaN heterostructures (HS) for various In concentrations (x = 6.7–20.8%). We found a luminescence peak, clearly dependent on the In content, that is attributed to the recombination between electrons in the 2DEG at the second level (E n=2) and photoexcited holes in the GaN buffer. The results can be understood with the changing band profile attributed to the different polarization gradient between InAlN and GaN.