Published in
Elsevier, Journal of Crystal Growth, 1-4(272), p. 76-80
DOI: 10.1016/j.jcrysgro.2004.08.134
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Optimization of GaN MOVPE growth on patterned Si substrates using spectroscopic in situ reflectance
Journal article published in 2004 by
A. Strittmatter 
,
L. Reißmann,
T. Trepk,
U. W. Pohl,
D. Bimberg,
J.-T. Zettler
,
L. Reißmann,
T. Trepk,
U. W. Pohl,
D. Bimberg,
J.-T. Zettler
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