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IOP Publishing, Applied Physics Express, 1(4), p. 011001, 2011

DOI: 10.1143/apex.4.011001

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Crack-Free, Highly Conducting GaN Layers on Si Substrates by Ge Doping

Journal article published in 2011 by Armin Dadgar ORCID, Jürgen Bläsing, Annette Diez, Alois Krost
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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