Published in
American Institute of Physics, Journal of Applied Physics, 5(86), p. 2602
DOI: 10.1063/1.371098
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Reflectivity investigations as a method for characterizing group III nitride films
Journal article published in 1999 by
S. Shokhovets,
R. Goldhahn 
,
G. Gobsch,
T. S. Cheng,
C. T. Foxon,
G. D. Kipshidze,
W.-O. Richter
,
G. Gobsch,
T. S. Cheng,
C. T. Foxon,
G. D. Kipshidze,
W.-O. Richter
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
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