Published in
American Institute of Physics, Journal of Applied Physics, 1(94), p. 307-312, 2003
DOI: 10.1063/1.1582369
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Determination of the anisotropic dielectric function for wurtzite AlN and GaN by spectroscopic ellipsometry
Journal article published in 2003 by
S. Shokhovets,
R. Goldhahn 
,
G. Gobsch,
S. Piekh,
R. Lantier,
A. Rizzi,
V. Lebedev,
W. Richter
,
G. Gobsch,
S. Piekh,
R. Lantier,
A. Rizzi,
V. Lebedev,
W. Richter
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
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