Published in
Cambridge University Press, Microscopy and Microanalysis, S3(20), p. 260-261, 2014
DOI: 10.1017/s143192761400302x
Links
Tools
New Approaches for Measuring Electrostatic Potentials and Charge Density Distributions in Working Devices Using Off-Axis and In-Line Electron Holography
Journal article published in 2014 by
Rafal E. Dunin-Borkowski,
Vadim Migunov 
,
Andrew London ,
Michael Farle,
Amir H. Tavabi ,
Giulio Pozzi
,
Andrew London ,
Michael Farle,
Amir H. Tavabi ,
Giulio Pozzi
This paper is made freely available by the publisher.
Full text: Download
Postprint:
archiving forbidden
Published version:
archiving forbidden
Data provided by 