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International Union of Crystallography, Journal of Synchrotron Radiation, 3(22), p. 776-780, 2015

DOI: 10.1107/s1600577515003707

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Soft X-ray Angle Resolved Photoemission with Micro Positioning Techniques for Metallic V$_2$O$_3$

Journal article published in 2015 by Hidenori Fujiwara, Takayuki Kiss, Yuki K. Wakabayashi, Yuki K. Wakabayashi, Yoshito Nishitani, Takeo Mori, Yuki Nakata, Satoshi Kitayama, Kazuaki Fukushima, Shinji Ikeda, Hiroto Fuchimoto, Yosuke Minowa, Sung‐Kwan K. Mo ORCID, Jonathan D. Denlinger, James W. Allen and other authors.
This paper is made freely available by the publisher.
This paper is made freely available by the publisher.

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Abstract

Soft X-ray angle-resolved photoemission has been performed for metallic V2O3. By combining a microfocus beam (40 µm × 65 µm) and micro-positioning techniques with a long-working-distance microscope, it has been possible to observe band dispersions from tiny cleavage surfaces with a typical size of several tens of µm. The photoemission spectra show a clear position dependence, reflecting the morphology of the cleaved sample surface. By selecting high-quality flat regions on the sample surface, it has been possible to perform band mapping using both photon-energy and polar-angle dependences, opening the door to three-dimensional angle-resolved photoemission spectroscopy for typical three-dimensional correlated materials where large cleavage planes are rarely obtained.