Published in
Materials Research Society, Materials Research Society Symposium Proceedings, (609), 2000
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Topological signatures of medium range order in amorphous semiconductor models
Journal article published in 2000 by
M. M. J.; Voyles P. M.; Gibson J. M. Treacy,
P. M. Voyles 
,
J. M. Gibson
,
J. M. Gibson
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Abstract
The topological local cluster (or Schlaefli cluster) concept of Marians and Hobbs is used to detect topologically crystalline regions in models of disordered tetrahedral semiconductors. The authors present simple algorithms for detecting both Wells-type shortest circuits and O'Keeffe-type rings, which can be used to delineate alternative forms of the Schlaefli cluster in models.