Published in
American Institute of Physics, Applied Physics Letters, 2(106), p. 023508, 2015
DOI: 10.1063/1.4906199
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Remote surface roughness scattering in fully depleted silicon-on-insulator devices with high-κ/SiO2 gate stacks
Journal article published in 2015 by
Yann-Michel Niquet,
I. Duchemin,
V.-H. Nguyen 
,
F. Triozon,
D. Rideau
,
F. Triozon,
D. Rideau
This paper is available in a repository.
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