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American Institute of Physics, Journal of Applied Physics, 12(96), p. 7108

DOI: 10.1063/1.1812362

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Controlled growth of O-polar ZnO epitaxial film by oxygen radical preconditioning of sapphire substrate

Journal article published in 2004 by Z. X. Mei, Y. Wang, X. L. Du, M. J. Ying, Z. Q. Zeng ORCID, H. Zheng ORCID, J. F. Jia, Q. K. Xue, Z. Zhang
This paper is available in a repository.
This paper is available in a repository.

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Abstract

Oxygen radicals pregrowth treatment and surface nitridation were used to eliminate Zn-polar inversion domains and control the growth of single-domain O-polar ZnO film on sapphire (0001) substrate by rf plasma-assisted molecular beam epitaxy. We found that the formation of oxygen-terminated sapphire surface prior to nitridation is crucial for achieving the anion polarity in subsequent AlN and ZnO layers, as demonstrated by formation of the 3×3 surface reconstruction during ZnO growth and ex situ polarity determination. This method, in general, can be applied to growth of other polar films, such as II-VI oxides and III-V nitrides, on sapphire (0001) substrates