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American Institute of Physics, Applied Physics Letters, 25(107), p. 252105

DOI: 10.1063/1.4938471

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Hall and Seebeck measurements estimate the thickness of a (buried) carrier system: Identifying interface electrons in In-doped SnO2 films

Journal article published in 2015 by Alexandra Papadogianni ORCID, Mark E. White, James S. Speck, Zbigniew Galazka, Oliver Bierwagen ORCID
This paper is available in a repository.
This paper is available in a repository.

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