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Royal Society of Chemistry, Nanoscale, 6(5), p. 2285

DOI: 10.1039/c3nr34042b

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Formation of secondary Moire patterns for characterization of nanoporous alumina structures in multiple domains with different orientations

Journal article published in 2013 by Qinghua Wang, Satoshi Kishimoto, Xiangfen Jiang ORCID, Yusuke Yamauchi ORCID
This paper is available in a repository.
This paper is available in a repository.

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Abstract

We first report the formation of secondary Moiré patterns from electron Moiré fringes to characterize nanostructures in multiple domains with different orientations. The pitches and the orientations of the nanoporous alumina arrays in several domains are simultaneously measured using only one electron Moiré image.