Published in

Trans Tech Publications, Advanced Materials Research, (1125), p. 143-147, 2015

DOI: 10.4028/www.scientific.net/amr.1125.143

Links

Tools

Export citation

Search in Google Scholar

Investigation of Deposition Parameters Dependence on Sputtered Cu2ZnSnSe4 Thin Films Properties

This paper is available in a repository.
This paper is available in a repository.

Full text: Download

Red circle
Preprint: archiving forbidden
Red circle
Postprint: archiving forbidden
Green circle
Published version: archiving allowed
Data provided by SHERPA/RoMEO

Abstract

Cu2ZnSnSe4(CZTSe) thin films were deposited by sputtering process using powder compacted target of CuSe, ZnSe and SnSe on Corning 1737 glass for Indium-free thin film solar cell application. Film composition,structure and properties were investigated by varying deposition parameters,such as substrate temperature,film thickness and RF power in order to deposit films with a stoichiometric composition and single phase of CZTSe. At an optimal condition of experiment,substrate temperature toward 1500C,RF power 75W, CZTSe films near stoichiometric composition with a polycrystalline stannite single phase were successfully deposited. Film thickness was little dependency with structure and composition except optical transmittance of the films. And it was observed to have a absorption coefficient of up to 104cm-1, band gap energy of 1.5 eV, carrier concentration in order of 1019cm-3, mobility of 100cm2V-1s-1and resistivity of 10-1-103Ωcm.It was also showed that all films were identified asp-type semiconductor.