In this activity, students use a model created from a coffee cup or cardstock cutout to explore the working principle of an atomic force microscope (AFM). Students manipulate a model of an AFM, using it to examine various objects to retrieve topographic data and then graph and interpret results. The students observe that movement of the AFM cantilever can be monitored by the deflection of a laser beam. Goals for the students are to examine macroscopic objects and relate their measurement technique to the atomic- and molecular-scale measurements of an actual AFM.Keywords (Audience): First-Year Undergraduate/General; High School/Introductory Chemistry