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American Institute of Physics, Applied Physics Letters, 11(85), p. 1946

DOI: 10.1063/1.1790599

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Recombination dynamics of localized excitons in InGaN quantum dots

Journal article published in 2004 by T. Bartel, M. Dworzak, M. Strassburg, A. Hoffmann, A. Strittmatter ORCID, D. Bimberg
This paper is available in a repository.
This paper is available in a repository.

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Abstract

Indium-rich fluctuations in ultrathin InGaN layers act at low temperatures as a dense ensemble of quantum dots (QD). This leads to a complex potential landscape with localization sites of widely varying depth for excitons. We report on investigations of the recombination mechanisms of excitons localized in InGaN/GaN QD structures by time-resolved and spatially resolved photoluminescence (PL) measurements. The structures were grown by metal-organic chemical-vapor deposition on Si (111) substrates. Sharp lines originating from single QDs could be observed. Their PL decays show monoexponential behavior. Similar transition energies have different time constants. Thus, the well-known nonexponential PL decay of the QD ensemble is assigned to the summation of monoexponential decays originating from individual QDs with different exciton lifetimes.