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Elsevier, Thin Solid Films, 1-2(373), p. 15-18

DOI: 10.1016/s0040-6090(00)01081-6

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The formation of CdTe thin films by the stacked elemental layer method

Journal article published in 2000 by L. R. Cruz, R. R. de Avillez ORCID
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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Abstract

Cadmium telluride thin films have been produced using the Stacked Elemental Layer technique. The films were characterized using X-ray diffraction, optical transmittance and reflectance, and atomic force microscopy. The evolution of the thin film reaction and compound formation were studied using X-ray data. The results show that the growth is diffusion controlled and the activation energy is 81.8 kJ/mol. In addition, some physical properties of the films produced are reported.