Structural quality of lead sulphide thin films synthesized on glass substrate by ultraviolet pulsed laser deposition with different flux density has been studied. Confirmation of phase of this compound was estimated using XRD data. Surface morphology of the samples was examined using AFM. Optical properties were studied at room temperature by reflectance measurements. Studies revealed that there is an improvement in the structural quality with increasing the laser flux density in some range. However, too high laser flux density could lead to the degradation in structural quality of thin film. Reflection data shows a reflectance of the film depends upon the flux density of the laser also. SEM investigation of the samples reveals that the surface morphology of the films and confirm the AFM results.