American Institute of Physics, Journal of Applied Physics, 6(96), p. 3302-3306, 2004
DOI: 10.1063/1.1782954
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The stability diagrams and simulation of finite temperature current-voltage characteristics for metallic double-dot devices, were analyzed. The systematic analysis of stability diagrams was described which depends on each of coupling capacitances for the metallic double-dot device. It was observed that the cross-couplings essentially effect both size and shape of diagram cells. The results shows that negative differential conductance (NDC) is suppressed by increasing temperature and/or introducing offset charge and is very sensitive to device parameters.