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American Chemical Society, Chemistry of Materials, 11(27), p. 4093-4098, 2015

DOI: 10.1021/acs.chemmater.5b01118

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Dominance of Interface Chemistry over the Bulk Properties in Determining the Electronic Structure of Epitaxial Metal/Perovskite Oxide Heterojunctions

This paper is available in a repository.
This paper is available in a repository.

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Abstract

We show that despite very similar crystallographic properties and work function values in bulk Fe and Cr, epitaxial films of these metals on Nb:SrTiO3(001) exhibit completely different heterojunction electronic properties. The Cr/SrTiO3 interface is Ohmic, whereas Fe/SrTiO3 forms a Schottky barrier with a barrier height of 0.50 eV. This differ-ence arises because of variations in interface chemistry. In contrast to Cr [Chambers, S. A. et al., Adv. Mater. 2013, 25, 4001.], in-diffused Fe exhibits a +2 oxidation state and occupies Ti sites in the perovskite lattice, resulting in negligible charge transfer to Ti, upward band bending, and Schottky barrier formation. The differences between Cr and Fe are understood by performing first-principles calculations of the energetics of defect formation which corroborate experimental results.