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Wiley, Journal of the American Ceramic Society, 6(98), p. 1848-1857, 2015

DOI: 10.1111/jace.13535

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Domain Wall Motion Across Various Grain Boundaries in Ferroelectric Thin Films

Journal article published in 2015 by Daniel M. Marincel ORCID, Huairuo Zhang ORCID, Stephen Jesse, Alex Belianinov ORCID, Mahmut B. Okatan ORCID, Sergei V. Kalinin ORCID, W. Mark Rainforth, W. Mark Rainforth ORCID, Ian M. Reaney, Clive A. Randall, Susan Trolier‐McKinstry
This paper is made freely available by the publisher.
This paper is made freely available by the publisher.

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Abstract

Domain wall movement at and near engineered 10°, 15°, and 24° tilt and 10° and 30° twist grain boundaries was measured by band excitation piezoresponse force microscopy for Pb(Zr,Ti)O3 films with Zr/Ti ratio of 45/55 and 52/48. A minimum in nonlinear response was observed at the grain boundary for the highest angle twist and tilt grain boundaries, while a maximum in nonlinear response was observed at the 10° tilt grain boundaries. The observed nonlinear response was correlated with the domain configurations imaged in cross section by transmission electron microscopy.