The Schottky–Mott Rule Expanded for Two-Dimensional Semiconductors: Influence of Substrate Dielectric Screening
Journal article published in 2021 by
Soohyung Park 
,
Thorsten Schultz ,
Dongguen Shin,
Niklas Mutz ,
Areej Aljarb ,
Hee Seong Kang,
Chul-Ho Lee ,
Lain-Jong Li,
Xiaomin Xu,
Vincent Tung,
Emil J. W. List-Kratochvil ,
Sylke Blumstengel,
Patrick Amsalem ,
Norbert Koch
,
Thorsten Schultz ,
Dongguen Shin,
Niklas Mutz ,
Areej Aljarb ,
Hee Seong Kang,
Chul-Ho Lee ,
Lain-Jong Li,
Xiaomin Xu,
Vincent Tung,
Emil J. W. List-Kratochvil ,
Sylke Blumstengel,
Patrick Amsalem ,
Norbert Koch
This paper is made freely available by the publisher.
Full text: Download
Preprint: archiving allowed
- Must obtain written permission from Editor
- Must not violate ACS ethical Guidelines
Postprint:
archiving restricted
- Must obtain written permission from Editor
- Must not violate ACS ethical Guidelines
Published version:
archiving forbidden
Data provided by 